Kelvin Probe Force Microscopy (KPFM) is a powerful scanning probe microscopy technique that measures the surface potential of materials at the nanoscale. This method is essential for characterizing electronic properties of nanofluidic devices, as it provides insights into charge distributions and surface phenomena that are critical for their performance. By using a vibrating cantilever to detect changes in electrostatic forces, KPFM enables researchers to investigate material interfaces, surface modifications, and interactions at a level of detail that is particularly relevant for the development of advanced lab-on-a-chip applications.
congrats on reading the definition of Kelvin Probe Force Microscopy. now let's actually learn it.