Atomic Layer Deposition (ALD) is a thin-film deposition technique that allows for the precise control of film thickness at the atomic level. This method relies on alternating exposure of a substrate to different precursors, resulting in self-limiting reactions that enable the growth of ultra-thin and conformal coatings. ALD is significant for its applications in various fields, particularly in the manufacturing of nanoscale devices, flow sensors, and pressure sensors, where precise material properties are essential.
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