High-speed atomic force microscopy (AFM) is a cutting-edge imaging technique that allows for the rapid acquisition of high-resolution images of surfaces at the nanoscale, making it invaluable for observing dynamic processes in real time. This technology enhances traditional AFM by employing advanced scanning mechanisms and faster cantilevers, which significantly reduce the time required to capture images while maintaining high resolution. By enabling researchers to visualize biological and material samples under near-physiological conditions, high-speed AFM bridges the gap between static imaging and dynamic observation.
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